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The international Sematech consortium announced that SOI wafer leader Soitec has joined the Front End Processes (FEP) and Advanced Metrology Programs Thumbnail

The international Sematech consortium announced that SOI wafer leader Soitec has joined the Front End Processes (FEP) and Advanced Metrology Programs

Posted on January 27, 2012
In Industry Buzz
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The international Sematech consortium announced that SOI wafer leader Soitec has joined the Front End Processes (FEP) and Advanced Metrology Programs. Soitec will collaborate with SEMATECH’s material and metrology experts and leverage Sematech’s activities in advanced metrology, materials, process technology, and device characterization to extend CMOS and high-mobility FinFET technologies for high-performance, low-power IC applications.

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