IBM: FinFET Isolation Considerations and Ramifications – Bulk vs. SOI
Posted by Terence HOOK (IBM) on April 18, 2013In Advanced Substrate Corners, Design & Manufacturing, In & Around Our Industry, R&D/Labnews
Tagged with 14nm, design, FinFET, foundry, IBM, manufacturing, R&D, silicon-on-insulator, SOC, SOI, wafers
Fully-depleted transistor technologies, both planar and fin-type, are now in the mainstream for product designs. One of the many interesting topics in the new 3D FinFET technology is the approach to isolation. In this article, key elements that differentiate junction-isolated (bulk) and dielectric-isolated (SOI) FinFET transistors are discussed, encompassing aspects of process integration, device design, …
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