ASN

Archive of R&D/Labnews

The Next Big Thing Thumbnail

The Next Big Thing

Posted on July 26, 2010
In Advanced Substrate Corners, ASN #15, R&D/Labnews
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Leading equipment and materials suppliers have created the European 450mm Equipment and Materials Initiative – or EEMI 450, for short. The steering committee comprises two substrate manufacturers (Soitec and Siltronic), three equipment suppliers (ASML, ASM, Recif), academics (IMEC, FHG) and Intel. EEMI 450’s global counterparts are ITB-J (Interoperability Test Bed – Japan) and ISMI (International …

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EC Approves €200 Million NanoSmart

Posted on October 31, 2008
In ASN #8, In & Around Our Industry, R&D/Labnews
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Project targets advanced materials for improved performance and electrical consumption. The Soitec Group, CEA-LETI and the French Agency for Industrial Innovation (AII) have teamed up on a new, €200 million materials research program dubbed the “NanoSmart” project. Nelly Kernevez, a well-known Léti researcher who recently joined Soitec, will head up the project. The European Commission …

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3D at the Wafer Level

Posted by Carlos MAZURE (Soitec) on July 16, 2008
In Advanced Substrate Corners, ASN #10, R&D/Labnews
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Soitec’s core technologies are building blocks for 3D integration. At the wafer level, molecular bonding techniques and Smart Cut technology add significant value to 3D integration. A good application for these building blocks is backside illuminated image sensors (BIS), which is probably the most mature 3D technology and close to mass production. For standard front …

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The Promise of FD-SOI for Low Power Applications Thumbnail

The Promise of FD-SOI for Low Power Applications

Posted by Olivier FAYNOT (CEA-Leti) on May 14, 2008
In Advanced Substrate Corners, ASN #9, R&D/Labnews
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CEA-LETI reports on FD-SOI technology developed for the 32nm node and beyond. A Fully Depleted SOI CMOS technology has been developed at CEA-LETI for Low Power applications at 32nm nodes and below. For years, fully depleted devices have been considered as electrostatic boosters due the fact that they benefit from smaller short channel effects than …

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SOI Substrates Meet Needs of Advanced Devices Thumbnail

SOI Substrates Meet Needs of Advanced Devices

Posted by Bich-Yen NGUYEN (Soitec) on May 14, 2008
In Advanced Substrate Corners, ASN #9, R&D/Labnews
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The ITRS calls for ultra-thin body devices to enter manufacturing in just a few years. The stringent SOI substrate requirements are met with high-volume manufacturing technology. SOI technology is developing toward Ultra-Thin Body (UTB) semiconductor layers with fully depleted (FD-SOI) and Multiple Gate FETs (MuGFETs), consistent with the latest version of the ITRS. The current …

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SOI for Memory Applications

Posted by Dr. Mohamad SHASHEEN (Soitec) on October 31, 2007
In Advanced Substrate Corners, ASN #8, R&D/Labnews
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SOI-based memory reverses cache crunch and simplifies DRAM scaling, boosting performance and reducing cost. Memory today represents about 25% of the estimated $260B worldwide semiconductor market. The two dominant players are DRAM (56%) and FLASH (33%). Further, memory in the form of embedded SRAM cache is becoming the dominant area user and technology driver for …

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SPOTlight on Smart Power Thumbnail

SPOTlight on Smart Power

Posted on May 11, 2007
In ASN #7, In & Around Our Industry, R&D/Labnews
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SOI-based Smart Power Innovator Atmel leads new Medea+ program. Atmel, a leading proponent of SOI for Smart Power, is heading up a new Medea+ program called SPOT-2 (program #2T205), for Deep Sub-micron Smart-Power Technologies. The 3-year program aims to develop a new generation of Smart Power Technologies for automotive and consumer applications. More than a …

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Industry SOI Innovators in Core Group Guiding Massive European Nanoelectronics Initiative

Posted on May 11, 2007
In ASN #7, In & Around Our Industry, R&D/Labnews
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Eight key industrial players in nanoelectronics have created the legal entity for partnering with the EC’s €3 billion Joint Technology Initiative. With the legalities now in place, the greater nanoelectronics community is set to play a significant role in defining the future of nanoelectronics R&D in Europe.

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High-k and Metal Gates Pave the Way to Further Innovation Thumbnail

High-k and Metal Gates Pave the Way to Further Innovation

Posted by Carlos MAZURE (Soitec) on May 11, 2007
In Advanced Substrate Corners, ASN #7, R&D/Labnews
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Here’s why HK+MG+SOI promises to be a winning combination. Seen as a necessary innovation to assure the IC scaling path, high-k gate dielectrics combined with metal gates have been in development for more than a decade. Recent announcements by IC technology leaders highlight the transition from R&D to early manufacturing for high-k and metal gate …

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UT BOX SOI: Engineering for Future Low-Power Applications Thumbnail

UT BOX SOI: Engineering for Future Low-Power Applications

Posted by Carlos MAZURE (Soitec) on December 6, 2006
In Advanced Substrate Corners, ASN #6, R&D/Labnews
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Ultra-thin buried oxide may solve some key design challenges at 32nm. Leading-edge microprocessors built on SOI have maximized performance while respecting the power budget by decoupling the Si surface from the substrate with a 150nm-thick buried oxide (BOX). However, moving towards low-power, high- or mid-performance CMOS applications, an increased coupling between the top layer of …

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