ASN

Articles by Éric MOUNIER

Éric MOUNIER

Éric MOUNIER has written 2 articles on Advanced Substrate News.

Dr. Eric Mounier has a PhD in microelectronics from the INPG in Grenoble. In 1998, he co-founded Yole Developpement, a market research company based in France. At Yole, Dr. Mounier is in charge of market analysis for MEMS, equipment & material. He is also Chief Editor of Micronews and MEMS Trends magazines.

SOI for MEMS: A Promising Material Thumbnail

SOI for MEMS: A Promising Material

Posted by Éric MOUNIER (Yole Développement) on March 25, 2011
In ASN #17, In & Around Our Industry, MEMS, News & Viewpoints
Tagged with , , , ,

A new Yole report highlights growth of SOI MEM S. Although MEMS technologies are not driven by CD shrinking as ICs, that does not mean MEMS do not undergo strong technological evolutions. The ever-growing MEMS markets, today mostly driven by consumer applications, now have to be performance-driven, cost-driven and size driven. SOI wafers are a …

Continue ReadingLeave a Comment
3D ICs: Opportunities & Timing Thumbnail

3D ICs: Opportunities & Timing

Posted by Éric MOUNIER (Yole Développement) on August 16, 2008
In ASN #10, News & Viewpoints, SOI In Action
Tagged with , , ,

A new study from Yole on 3D ICs sees a bright future for applications, markets and active layer transfer technology. Chip performance, size and functionality – especially for consumer electronics – will drive the industry to adopt 3D stacked chips with through-silicon vias (TSVs) replacing wire bonding for certain markets in the 2009-2015 time frame. …

Continue ReadingLeave a Comment